Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023)
STANDARD published on 1.6.2014
Designation standards: ASTM F1262M-14
Note: WITHDRAWN
Publication date standards: 1.6.2014
The number of pages: 6
Approximate weight : 18 g (0.04 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
digital integrated circuits, digital IC´s, functional errors, ionizing, pulsed radiation, radiation, transient radiation, upset threshold, ICS Number Code 031.200 ()