ASTM F1263-11

Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts

STANDARD published on 1.6.2011

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The information about the standard:

Designation standards: ASTM F1263-11
Note: WITHDRAWN
Publication date standards: 1.6.2011
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F1263-11 :

Keywords:
confidence, rejection, overtest data, statistical analysis, Acceptance criteria/testing, Data analysis, Electrical conductors (semiconductors), Estimated survival probability, Failure end point--electronic components/devices, Microelectronic devices, Overtest data, Probability of survival, Quality assurance (QA), Stress--electronic components/device, ICS Number Code 31.020 (Electronic components in general)