Standard Guide for Use of an X-Ray Tester (approximately equal10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
STANDARD published on 1.10.2011
Designation standards: ASTM F1467-11
Note: WITHDRAWN
Publication date standards: 1.10.2011
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
ionizing radiation effects, microcircuits, radiation hardness, semiconductor devices, X-ray testing: Collimator/collimation, Electrical conductors (semiconductors), Electronic hardness, Experimental design/evaluation, Ionizing radiation, Low-energy radiation, Microcircuits, Microelectronic devices, Radiation exposure--electronic components/devices, Radiation-hardness testing, Semiconductor device testing, X-ray testing, ICS Number Code 31.020 (Electronic components in general)