Standard Test Method for Sheet Resistance Uniformity Evaluation by In-Line Four-Point Probe with the Dual-Configuration Procedure (Withdrawn 2003)
STANDARD published on 5.12.1997
Designation standards: ASTM F1529-97
Note: WITHDRAWN
Publication date standards: 5.12.1997
The number of pages: 13
Approximate weight : 39 g (0.09 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
epitaxy, four-point probe, ion implant, metallization, polysilicon, sheet resistance, silicon, ICS Number Code 29.045 (Semiconducting materials)