Standard Test Method for Carrier Recombination Lifetime in Silicon Wafers by Noncontact Measurement of Photoconductivity Decay by Microwave Reflectance (Withdrawn 2003)
STANDARD published on 10.6.2000
Designation standards: ASTM F1535-00
Note: WITHDRAWN
Publication date standards: 10.6.2000
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
Carrier recombination lifetime, Contactless measurement, Free carrier density, Impurities-semiconductors, Microwave reflection, Photoconductivity decay, Recombination lifetime, Silicon semiconductors-slices/wafers, carrier recombination lifetime-silicon wafers, by noncontact measurement, of photoconductivity decay by microwave reflectance, test, ICS Number Code 29.045 (Semiconducting materials)