Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Resolution Glow Discharge Mass Spectrometer

The information about the standard:

Designation standards: ASTM F1845-08
Note: WITHDRAWN
Publication date standards: 15.6.2008
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F1845-08 :

Keywords:
aluminum, aluminum-copper alloys, aluminum-copper-silicon alloys, aluminum-silicon alloys, electronics, glow discharge mass spectrometer (GDMS), purity analysis, sputtering target, trace metallic impurities, Impurities--electronic materials/applications, Mass spectrometry--electronic materials/applications, Trace metallic impurities, Aluminum alloys (electronic), Aluminum electrical conductors (semiconductors), Electronic-grade metals, Glow discharge mass spectrometer (GDMS)