ASTM F1892-12

Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

STANDARD published on 1.7.2012

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The information about the standard:

Designation standards: ASTM F1892-12
Note: WITHDRAWN
Publication date standards: 1.7.2012
The number of pages: 41
Approximate weight : 123 g (0.27 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F1892-12 :

Keywords:
ASIC (application specific integrated circuit), bipolar, cobalt 60 testing, ELDRS (enhanced low dose rate sensitivity), gamma ray tests, ionizing radiation testing, MOS, radiation hardness, semiconductor devices, time dependent effects, total dose testing, X-ray testing, ICS Number Code 31.080.01 (Semi-conductor devices in general)