ASTM F1893-11

Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

STANDARD published on 1.1.2011

English -
PDF - Immediate download (75.00 USD)

The information about the standard:

Designation standards: ASTM F1893-11
Note: WITHDRAWN
Publication date standards: 1.1.2011
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F1893-11 :

Keywords:
burnout, failure, high dose-rate, integrated circuits, ionizing radiation, latchup, microcircuits, semiconductor devices, survivability, ICS Number Code 31.080.01 (Semi-conductor devices in general)