ASTM F1893-18

Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Withdrawn 2023)

STANDARD published on 1.3.2018

English -
electronic design (pdf) (75.00 USD)

The information about the standard:

Designation standards: ASTM F1893-18
Note: WITHDRAWN
Publication date standards: 1.3.2018
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F1893-18 :

Keywords:
burnout, failure, high dose-rate, integrated circuits, ionizing radiation, latchup, microcircuits, semiconductor devices, survivability,, ICS Number Code 31.080.01 (Semi-conductor devices in general)