Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023)
STANDARD published on 1.5.2016
Designation standards: ASTM F744M-16
Note: WITHDRAWN
Publication date standards: 1.5.2016
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
DIC, digital integrated circuits, dose rate, ionizing radiation, radiation dose rate, threshold for upset, upset ,, ICS Number Code 31.200 (Integrated circuits. Microelectronics)