ASTM F980-16

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

STANDARD published on 1.12.2016

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The information about the standard:

Designation standards: ASTM F980-16
Note: WITHDRAWN
Publication date standards: 1.12.2016
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F980-16 :

Keywords:
annealing factor, annealing function, displacement damage, integrated circuits, neutron damage, neutron degradation, photoconducting device, rapid annealing, semiconductor devices ,, ICS Number Code 29.045 (Semiconducting materials)