BS CECC 00013:1985

Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice.

STANDARD published on 30.8.1985

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The information about the standard:

Designation standards: BS CECC 00013:1985
Note: WITHDRAWN
Publication date standards: 30.8.1985
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: British technical standard
Category: Technical standards BS