Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV).
STANDARD published on 28.2.2011
Designation standards: BS EN 15991:2011
Note: WITHDRAWN
Publication date standards: 28.2.2011
The number of pages: 32
Approximate weight : 96 g (0.21 lbs)
Country: British technical standard
Category: Technical standards BS