BS EN 60749-14:2003

Semiconductor devices. Mechanical and climatic test methods. Robustness of terminations (lead integrity).

STANDARD published on 15.12.2003

The information about the standard:

Designation standards: BS EN 60749-14:2003
Publication date standards: 15.12.2003
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: British technical standard
Category: Technical standards BS