Semiconductor devices. Mechanical and climatic test methods. Neutron irradiation.
STANDARD published on 29.6.2004
Designation standards: BS EN 60749-17:2003
Note: WITHDRAWN
Publication date standards: 29.6.2004
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: British technical standard
Category: Technical standards BS