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BS EN 60749-20:2003

Semiconductor devices. Mechanical and climatic test methods. Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat.

STANDARD published on 7.7.2003

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The information about the standard:

Designation standards: BS EN 60749-20:2003
Note: WITHDRAWN
Publication date standards: 7.7.2003
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: British technical standard
Category: Technical standards BS