Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level.
STANDARD published on 10.7.2017
Designation standards: BS EN 60749-28:2017
Note: WITHDRAWN
Publication date standards: 10.7.2017
The number of pages: 50
Approximate weight : 150 g (0.33 lbs)
Country: British technical standard
Category: Technical standards BS