BS EN 60749-29:2003

Semiconductor devices. Mechanical and climatic test methods. Latch-up test.

STANDARD published on 29.6.2004

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The information about the standard:

Designation standards: BS EN 60749-29:2003
Note: WITHDRAWN
Publication date standards: 29.6.2004
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: British technical standard
Category: Technical standards BS