BS EN 60749-38:2008

Semiconductor devices. Mechanical and climatic test methods. Soft error test method for semiconductor devices with memory.

STANDARD published on 30.6.2008

The information about the standard:

Designation standards: BS EN 60749-38:2008
Publication date standards: 30.6.2008
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: British technical standard
Category: Technical standards BS