BS EN 60749-4:2002

Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST).

STANDARD published on 10.9.2002

The information about the standard:

Designation standards: BS EN 60749-4:2002
Note: WITHDRAWN
Publication date standards: 10.9.2002
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: British technical standard
Category: Technical standards BS