
Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST).
STANDARD published on 28.11.2017
Designation standards: BS EN 60749-4:2017
Publication date standards: 28.11.2017
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: British technical standard
Category: Technical standards BS
ISBN: 978 0 580 94229 7 Status: Definitive