BS EN 60749-43:2017

Semiconductor devices - Mechanical and climatic test methods. Guidelines for IC reliability qualification plans.

STANDARD published on 22.9.2017

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The information about the standard:

Designation standards: BS EN 60749-43:2017
Note: WITHDRAWN
Publication date standards: 22.9.2017
The number of pages: 44
Approximate weight : 132 g (0.29 lbs)
Country: British technical standard
Category: Technical standards BS