BS EN 60749-44:2016

Semiconductor devices. Mechanical and climatic test methods. Neutron beam irradiated single event effect (SEE) test method for semiconductor devices.

STANDARD published on 30.11.2016

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The information about the standard:

Designation standards: BS EN 60749-44:2016
Publication date standards: 30.11.2016
The number of pages: 26
Approximate weight : 78 g (0.17 lbs)
Country: British technical standard
Category: Technical standards BS

Annotation of standard text BS EN 60749-44:2016 :

ISBN: 978 0 580 86203 8 Status: Definitive