BS EN 60749-5:2003

Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test.

STANDARD published on 18.6.2003

The information about the standard:

Designation standards: BS EN 60749-5:2003
Note: WITHDRAWN
Publication date standards: 18.6.2003
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: British technical standard
Category: Technical standards BS