BS EN 62047-17:2015

Semiconductor devices. Micro-electromechanical devices. Bulge test method for measuring mechanical properties of thin films.

STANDARD published on 31.7.2015

English -
PDF - Immediate download (351.30 USD)

English -

Print design (351.30 USD)

The information about the standard:

Designation standards: BS EN 62047-17:2015
Publication date standards: 31.7.2015
The number of pages: 34
Approximate weight : 102 g (0.22 lbs)
Country: British technical standard
Category: Technical standards BS

Annotation of standard text BS EN 62047-17:2015 :

ISBN: 978 0 580 72203 5 Status: Definitive