
Semiconductor devices. Micro-electromechanical devices. Strip bending test method for tensile property measurement of thin films.
STANDARD published on 30.6.2011
Designation standards: BS EN 62047-8:2011
Publication date standards: 30.6.2011
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: British technical standard
Category: Technical standards BS
ISBN: 978 0 580 60629 8 Status: Definitive