BS EN 62373:2006

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET).

STANDARD published on 29.9.2006

The information about the standard:

Designation standards: BS EN 62373:2006
Publication date standards: 29.9.2006
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: British technical standard
Category: Technical standards BS