BS EN 62374-1:2010

Semiconductor devices. Time-dependent dielectric breakdown (TDDB) test for inter-metal layers.

STANDARD published on 30.6.2011

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The information about the standard:

Designation standards: BS EN 62374-1:2010
Publication date standards: 30.6.2011
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: British technical standard
Category: Technical standards BS

Annotation of standard text BS EN 62374-1:2010 :

ISBN: 978 0 580 75206 3 Status: Definitive