BS EN 62374:2007

Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films.

STANDARD published on 31.10.2008

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The information about the standard:

Designation standards: BS EN 62374:2007
Publication date standards: 31.10.2008
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: British technical standard
Category: Technical standards BS

Annotation of standard text BS EN 62374:2007 :

ISBN: 978 0 580 54048 6 Status: Under Review