BS EN 62417:2010

Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs).

STANDARD published on 30.6.2010

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The information about the standard:

Designation standards: BS EN 62417:2010
Publication date standards: 30.6.2010
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: British technical standard
Category: Technical standards BS

Annotation of standard text BS EN 62417:2010 :

ISBN: 978 0 580 58622 4 Status: Definitive