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BS EN IEC 60749-23:2026

Semiconductor devices. Mechanical and climatic test methods. High temperature operating life.

STANDARD published on 3.2.2026

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The information about the standard:

Designation standards: BS EN IEC 60749-23:2026
Publication date standards: 3.2.2026
The number of pages: 14
Approximate weight : 42 g (0.09 lbs)
Country: British technical standard
Category: Technical standards BS

Annotation of standard text BS EN IEC 60749-23:2026 :

ISBN: 978 0 539 35726 4 Status: Definitive