
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level.
STANDARD published on 22.12.2022
Designation standards: BS EN IEC 60749-28:2022-TC
Publication date standards: 22.12.2022
The number of pages: 124
Approximate weight : 403 g (0.89 lbs)
Country: British technical standard
Category: Technical standards BS
ISBN: 978 0 539 23857 0 Status: Definitive