BS EN IEC 60749-37:2022

Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using an accelerometer.

STANDARD published on 22.11.2022

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The information about the standard:

Designation standards: BS EN IEC 60749-37:2022
Publication date standards: 22.11.2022
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: British technical standard
Category: Technical standards BS

Annotation of standard text BS EN IEC 60749-37:2022 :

ISBN: 978 0 539 15199 2 Status: Definitive