BS EN IEC 60749-41:2020

Semiconductor devices. Mechanical and climatic test methods. Standard reliability testing methods of non-volatile memory devices.

STANDARD published on 9.9.2020

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The information about the standard:

Designation standards: BS EN IEC 60749-41:2020
Publication date standards: 9.9.2020
The number of pages: 26
Approximate weight : 78 g (0.17 lbs)
Country: British technical standard
Category: Technical standards BS

Annotation of standard text BS EN IEC 60749-41:2020 :

ISBN: 978 0 580 96287 5 Status: Definitive