BS IEC 62047-29:2017

Semiconductor devices. Micro-electromechanical devices. Electromechanical relaxation test method for freestanding conductive thin-films under room temperature.

STANDARD published on 15.3.2018

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The information about the standard:

Designation standards: BS IEC 62047-29:2017
Publication date standards: 15.3.2018
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: British technical standard
Category: Technical standards BS

Annotation of standard text BS IEC 62047-29:2017 :

ISBN: 978 0 580 94013 2 Status: Definitive