BS IEC 62047-35:2019

Semiconductor devices. Micro-electromechanical devices. Test method of electrical characteristics under bending deformation for flexible electromechanical devices.

STANDARD published on 20.4.2021

The information about the standard:

Designation standards: BS IEC 62047-35:2019
Publication date standards: 20.4.2021
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: British technical standard
Category: Technical standards BS