BS IEC 62047-43:2024

Semiconductor devices. Micro-electromechanical devices. Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices.

STANDARD published on 22.3.2024

The information about the standard:

Designation standards: BS IEC 62047-43:2024
Publication date standards: 22.3.2024
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: British technical standard
Category: Technical standards BS