BS IEC 62373-1:2020

Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET). Fast BTI test for MOSFET.

STANDARD published on 30.3.2023

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The information about the standard:

Designation standards: BS IEC 62373-1:2020
Publication date standards: 30.3.2023
The number of pages: 26
Approximate weight : 78 g (0.17 lbs)
Country: British technical standard
Category: Technical standards BS

Annotation of standard text BS IEC 62373-1:2020 :

ISBN: 978 0 580 51373 2 Status: Definitive