BS IEC 63068-3:2020

Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Test method for defects using photoluminescence.

STANDARD published on 24.7.2020

The information about the standard:

Designation standards: BS IEC 63068-3:2020
Publication date standards: 24.7.2020
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: British technical standard
Category: Technical standards BS