BS IEC 63229:2021

Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate.

STANDARD published on 31.8.2023

The information about the standard:

Designation standards: BS IEC 63229:2021
Publication date standards: 31.8.2023
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: British technical standard
Category: Technical standards BS