BS IEC 63275-1:2022

Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors. Test method for bias temperature instability.

STANDARD published on 5.10.2022

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The information about the standard:

Designation standards: BS IEC 63275-1:2022
Publication date standards: 5.10.2022
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: British technical standard
Category: Technical standards BS

Annotation of standard text BS IEC 63275-1:2022 :

ISBN: 978 0 539 12126 1 Status: Definitive