BS IEC 63284:2022

Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors.

STANDARD published on 11.11.2022

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The information about the standard:

Designation standards: BS IEC 63284:2022
Publication date standards: 11.11.2022
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: British technical standard
Category: Technical standards BS

Annotation of standard text BS IEC 63284:2022 :

ISBN: 978 0 539 12643 3 Status: Definitive