BS ISO 14237:2000

Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials.

STANDARD published on 15.4.2000

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The information about the standard:

Designation standards: BS ISO 14237:2000
Note: WITHDRAWN
Publication date standards: 15.4.2000
The number of pages: 32
Approximate weight : 96 g (0.21 lbs)
Country: British technical standard
Category: Technical standards BS