BS ISO 14606:2000

Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials.

STANDARD published on 15.1.2001

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The information about the standard:

Designation standards: BS ISO 14606:2000
Note: WITHDRAWN
Publication date standards: 15.1.2001
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: British technical standard
Category: Technical standards BS