BS ISO 14701:2011

Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness.

STANDARD published on 31.8.2011

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The information about the standard:

Designation standards: BS ISO 14701:2011
Note: WITHDRAWN
Publication date standards: 31.8.2011
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: British technical standard
Category: Technical standards BS