BS ISO 14701:2018

Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness.

STANDARD published on 5.11.2018

The information about the standard:

Designation standards: BS ISO 14701:2018
Publication date standards: 5.11.2018
The number of pages: 26
Approximate weight : 78 g (0.17 lbs)
Country: British technical standard
Category: Technical standards BS