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BS ISO 20263:2017

Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials.

STANDARD published on 4.1.2018

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The information about the standard:

Designation standards: BS ISO 20263:2017
Note: WITHDRAWN
Publication date standards: 4.1.2018
The number of pages: 54
Approximate weight : 162 g (0.36 lbs)
Country: British technical standard
Category: Technical standards BS