Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
STANDARD published on 1.1.2018
Designation standards: ČSN EN 60749-43
Classification mark: 358799
Catalog number: 504152
Note: WITHDRAWN
Publication date standards: 1.1.2018
The number of pages: 48
Approximate weight : 144 g (0.32 lbs)
Country: Czech technical standard
Category: Technical standards ČSN