ČSN EN 60749-29 (358799)

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

STANDARD published on 1.9.2004

The information about the standard:

Designation standards: ČSN EN 60749-29
Classification mark: 358799
Catalog number: 71195
Note: WITHDRAWN
Publication date standards: 1.9.2004
The number of pages: 48
Approximate weight : 144 g (0.32 lbs)
Country: Czech technical standard
Category: Technical standards ČSN