ČSN EN 60749-3 (358799)

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examinationt

STANDARD published on 1.4.2003

The information about the standard:

Designation standards: ČSN EN 60749-3
Classification mark: 358799
Catalog number: 66855
Note: WITHDRAWN
Publication date standards: 1.4.2003
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: Czech technical standard
Category: Technical standards ČSN